EMI stands for Electromagnetic Interference, which refers to the disruption caused by electromagnetic radiation on the operation of electronic devices. EMI can cause malfunctions, data loss, and other types of errors in electronic equipment. To prevent EMI, electronic devices must undergo EMI testing to determine their susceptibility to electromagnetic interference.
There are several methods for conducting EMI testing, and the most commonly used methods are:
Conducted EMI Testing: This method involves measuring the amount of noise that is conducted through the power lines and cables connected to the electronic device. The device is tested while it is operating, and the noise levels are measured at different frequencies.
Radiated EMI Testing: This method involves measuring the amount of electromagnetic radiation emitted by the device while it is operating. The device is placed in an anechoic chamber or on a test bench, and the radiation levels are measured at different frequencies.
Transient EMI Testing: This method involves measuring the response of the device to transient signals, such as lightning strikes, power surges, and other types of electromagnetic disturbances. The device is tested to see if it can withstand these types of disturbances without malfunctioning.
The above methods are carried out according to various EMI standards such as CISPR, FCC, and IEC. These standards specify the testing procedures and limits for different types of electronic devices, depending on their application and the environment in which they will be used.
